Micro-RDC developed a comprehensive Radiation Hardened by Design (RHBD) cell library for ASIC design using the IBM 9LP 90nm CMOS Process.
For further information on Micro-RDC Temporal Latch and MICE technology to mitigate SEU and SET see the following:
1- Mavis, D.G. and Eaton, P.H., “Temporally Redundant Latch for Preventing Single Event Disruptions in Sequential Integrated Circuits”, United States Patent Number 6,127,864, October 2000.
2- Mavis, D.G. and Eaton, P.H., “SEU and SET Modeling and Mitigation in Deep Submicron Technologies”, Proceedings of the International Reliability Symposium (IRPS) pp. 293-305, 2007.
3- Paul Eaton, "Multiply-Interlocked Cell Digital Logic Architecture for SEU and SET Immunity", 2012 SEE Symposium, San Diego.
Contact Micro-RDC for a complete list of existing library functions and new developments on more advanced process nodes.
Acknowledgements
In addition to the extensive work done by Micro-RDC in the development of the RHBD Cell Library, Micro-RDC acknowledges DTRA and NASA for their support in advancing the RHBD Cell Library development.