Microelectronics Research Development Corporation
KM-807701; Temporal LatchTM SEU Immune RHBD 90nm CMOS 8051XC Based SoC
Electronic integrated circuits providing radiation hardening for digital logic architecture
8051XC CPU 
  • 50 MHz Clock 
  • Average 8x Speed Up Over Standard 8051 
  • ALU Performs 8-bit Arithmetic, Multiplication and Division, and Boolean Manipulations 
  • Write to Program Memory RAM 
  • Two 8 bit I/O Ports (32 lines) 
  • Two 8 bit Bi-Directional Ports 
  • Three 16-bit Timer/Counters 
  • Real Time Clock (RTC) 
  • Watch Dog Timer 
  • 8 External Interrupts 
Temporal Latch Technology 
  • SEU Immune by Incorporating Temporal Latch Technology in all Sequential Logic 
Memory Sub Systems 
  • On Chip Internal RAM (256x8) 
  • Temporal Latch Based Flip Flops 
  • On Chip External 12 Kbytes Data RAM Design Hardened Distributed SRAM 
  • On Chip 64 KBytes Program RAM  
    • Bootup from External SPI EEPROM 
    • Design Hardened 64Kx8 Program SRAM w/EDAC 
  • On Chip ROM for Testing and Bootup 
  • SPI Slave for Firmware Download and Upload to Silicon  
  • Support for 128 Kbytes External SPI Non Volatile Memory 
Power Management Unit 
  • Idle and Deep Sleep 
  • Power Pins (Do Not Change in Idle or Deep Sleep or Reset) 
  • UART with FIFO and CTS/RTS DTR/DCD Support 
  • Four Serial Ports with Independent Baud Rate Generators 
  • USB 1.1 Host/Slave Controller 
  • Spacewire Multiple Rates Including 10 Mbps and 50 Mbps 
  • LVDS Driver/Receiver for Spacewire 
  • I2C Primary Master 
  • I2C Secondary Master 
  • SPI Master with 8 Slave Selects 
  • SPI Slave 
  • Test Bypass 
  • CRC Accelerator 
  • PWM 
  • PPS Input (Pulse Per Second) 
  • 7.004 mm X 7.324 mm  
  • 380 Pins, 192 CMOS I/O 
  • 64 um pad pitch 
  • 50 um X 50 um pad size 
Dual Voltage Supply 1.2V Core and 1.2V to 2.5V I/O
Block Diagram
LGA-484 Evaluation Chip
  • Total Ionizing Dose: Within specifications after exposure to greater than 1Mrad(Si) 
  • Single Event Latch Up: Latchup immune to 80 MeV-cm2/mg 
  • SRAM Error Rate: Supports scrubbing program SRAM to obtain desired error rates 
  • Single Event Transient: Implements the Temporal Latch-based flip flops to mitigate transient pulse widths of up to 1ns
This effort is sponsored by the Air Force Research Laboratory (AFRL).